Series 4C54 Nano Structure Rougness Meter With Parallel Port Output

4 C 5 4                  
 

Parallel Port Software Included
 
 
 
   

   
3D AutoCAD drawing of sensor (zipped)   -   DWG = [R13] [R14] [R2000]       DXF = [R13] [R14] [R2000]
Technical Data Description
Operating temp: - 20 ...+   60 degree C The Nano Structure Roughness Meter measure roughness of a surface from under 0.01 micro to 1 micro meter.
- 04 ...+ 140 degree F
Weight:    18 oz (0.5 kg)
Protection: IP 54, NEMA 3
Housing: Aluminum
Analyzed Surface Area: 1 mm x 1 mm
Capture Time: 1 second
Computer Screen
Dimensions
For a nominal charge of $100.00, Hohner Corp. will test and evaluate your samples to ensure this product meets your specific requirements and standards.  Should modifications be required, Hohner Corp. will advise in writing of any additional charges.  
1 800 295 5693 

UK   + 44 01978 363 888

BR   55 01938 775214